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| Recent Publications |
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For a general overview and validation of Luminescent’s Inverse Lithography Technology, please see
this paper presented at SPIE 2008.
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To learn about applying ILT as a powerful DFM tool, please see
this paper presented at SPIE 2008.
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To learn about Luminescent’s advanced 3-D modelling capability, please see
this paper presented at SPIE 2008.
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To see an example of an application of ILT by a customer on a real 55 nm product development, please see
this paper presented at SPIE 2008.
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To learn how you can use “MEEF-aware” process window analysis to improve your yield, please see
this paper presented at PMJ 2008,
and this paper presented at BACUS 2008. |
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